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Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 1995, San Jose, California

Price: 44.99 USD

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Author Name: Rajsuman, R.; Rajsuman, Rochit; IEEE Computer Society Technical Committee on Vlsi; IEEE International Workshop on Memory Technology, Design, and Testing; Rajkanan, K.; IEEE Computer Society Test Technology Technical Committee

Binding: Soft cover

Book Condition: Very Good

Type Book

Publisher Los Alamitos, California, U.S.A. IEEE Computer Society 1995

ISBN Number 0818671025 / 9780818671029

Seller ID 009358

Very good condition. No interior writing or highlighting. Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 1995, San Jose, California By Rajsuman, R.; Rajsuman, Rochit; IEEE Computer Society Technical Committee on Vlsi; IEEE International Workshop on Memory Technology, Design, and Testing; Rajkanan, K.; IEEE Computer Society Test Technology Technical Committee Product Details Paperback: 129 pages Publisher: Institute of Electrical & Electronics Enginee (August 1995) Language: English ISBN-10: 0818671025 ISBN-13: 978-0818671029 Product Dimensions: 11 x 8.5 x 0.5 inches

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